GitHub / PanithanS / MixedType-Wafers-Defect-Recognition-with-Visual-Transformer
We use MixedWM38, the mixed-type wafer defect pattern dataset for wafer defect pattern regcognition with visual transformers.
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License: mit
Language: Jupyter Notebook
Size: 188 KB
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Created at: over 1 year ago
Updated at: over 1 year ago
Pushed at: over 1 year ago
Last synced at: over 1 year ago
Topics: computer-vision, data-analysis, defect-classification, defect-detection, lithography, machine-learning, mixed-type-data-classification, mixedwm38, multilabel-classification, pattern-recognition, semiconductor-manufacturing, visual-transformer, wafer-defects, wafermap, yeild, yeild-opimization