GitHub / skswar / Manufacturing_Defect_Analysis_and_Visualization
🏭 This repository serves as a demonstration of how to analyze product defects and identify critical points within the product. By doing so, we can effectively troubleshoot and address potential issues to improve product quality and performance.
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PURL: pkg:github/skswar/Manufacturing_Defect_Analysis_and_Visualization
Stars: 0
Forks: 0
Open issues: 0
License: mit
Language: Jupyter Notebook
Size: 15 MB
Dependencies parsed at: Pending
Created at: about 2 years ago
Updated at: about 2 years ago
Pushed at: about 2 years ago
Last synced at: over 1 year ago
Commit Stats
Commits: 42
Authors: 1
Mean commits per author: 42.0
Development Distribution Score: 0.0
More commit stats: https://commits.ecosyste.ms/hosts/GitHub/repositories/skswar/Manufacturing_Defect_Analysis_and_Visualization
Topics: data-visualization, defect-analysis, descriptive-analysis, descriptive-statistics, plotly, product-analytics, quality-control