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GitHub / agarwalharshal / Automatic_Test_Pattern_Generation

Generation of test pattern or input vector for a given circuit consisting of stuck-at faults and to also determine the expected output. Submitted as part of the Grand Finale of Google Girl Hackathon 2023.

JSON API: http://repos.ecosyste.ms/api/v1/hosts/GitHub/repositories/agarwalharshal%2FAutomatic_Test_Pattern_Generation

Stars: 1
Forks: 0
Open issues: 0

License: None
Language: C++
Size: 11.7 KB
Dependencies parsed at: Pending

Created at: almost 2 years ago
Updated at: almost 2 years ago
Pushed at: almost 2 years ago
Last synced at: 2 months ago

Topics: cpp, logic-gates, structural-testing, stuck-at-faults

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